Fourier critical point analysis: extension to Gaussian lineshapes
1994; Elsevier BV; Volume: 32; Issue: 4 Linguagem: Inglês
10.1016/0927-0248(94)90104-x
ISSN1879-3398
Autores Tópico(s)Optical Coatings and Gratings
ResumoThe previous Fourier approach for the determination of critical point parameters is extended to Gaussian-broadened lineshapes. The type broadening is easily reognized in reciprocal space because the variations of ln Cn, where the Cn are the amplitude coefficients, are linear and quadratic in the index n for Lorentzian and Gaussian broadenings, respectively. In an example application, the broadening mechanism of the E1 transition of CdTe is shown to be unequivocally Lorentzian.
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