A beam profile monitor for secondary beams
1978; Elsevier BV; Volume: 156; Issue: 3 Linguagem: Inglês
10.1016/0029-554x(78)90738-3
ISSN1878-3759
AutoresG.J. Krausse, Peter Andreas Munch Gram,
Tópico(s)Particle Detector Development and Performance
ResumoWe describe a monitor, based on a multiwire proportional chamber, that displays with mm resolution the profiles of secondary particle beams ranging in intensity from 105/cm2-s to 1010/cm2-s. The display, which appears on a standard oscilloscope, is live and quantitative; the effect of adjustments of the beam transport is immediately and continuously visible.
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