A beam profile monitor for secondary beams

1978; Elsevier BV; Volume: 156; Issue: 3 Linguagem: Inglês

10.1016/0029-554x(78)90738-3

ISSN

1878-3759

Autores

G.J. Krausse, Peter Andreas Munch Gram,

Tópico(s)

Particle Detector Development and Performance

Resumo

We describe a monitor, based on a multiwire proportional chamber, that displays with mm resolution the profiles of secondary particle beams ranging in intensity from 105/cm2-s to 1010/cm2-s. The display, which appears on a standard oscilloscope, is live and quantitative; the effect of adjustments of the beam transport is immediately and continuously visible.

Referência(s)
Altmetric
PlumX