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Experimental triggers for internal short circuits in lithium-ion cells

2011; Elsevier BV; Volume: 196; Issue: 15 Linguagem: Inglês

10.1016/j.jpowsour.2011.03.035

1873-2755

Christopher J. Orendorff, E.P. Roth, Ganesan Nagasubramanian,

Reliability and Maintenance Optimization

Lithium-ion cell field failures due to internal short circuits are a significant concern to the entire lithium-ion cell market from consumer electronics to electric vehicles. While the probability of these failure events occurring is estimated to be very low (1 in 5–10 million), the consequences of a cell failure due to an internal short in a high energy battery system have the potential to be catastrophic. The statistical probability of one of these events is very low and they are difficult to predict and simulate in a laboratory using some external test; which makes cell failure due to an internal short circuit a unique challenge to overcome. Several of the experiments designed to simulate internal shorts have been adopted as testing protocols across the industry; in general, they do not accurately simulate an internal short. This work highlights our efforts to experimentally trigger an internal short circuit in a lithium-ion cell.