Combination of EELS modes and electron spectroscopic imaging and diffraction in an energy-filtering electron microscope
1992; Elsevier BV; Volume: 46; Issue: 1-4 Linguagem: Inglês
10.1016/0304-3991(92)90023-d
ISSN1879-2723
AutoresL. Reimer, I. Fromm, P. B. Hirsch, Ulrich Plate, R. Rennekamp,
Tópico(s)Molecular Junctions and Nanostructures
ResumoEnergy-filtering transmission electron microscopy (EFTEM) can be realized either with a dedicated STEM or with an imaging energy filter in a TEM. The conventional STEM and TEM modes can be combined in this way with the modes of electron spectroscopic imaging (ESI) and electron spectroscopic diffraction (ESD), and different modes can be used to record an electron energy-loss spectrum (EELS). An EFTEM can therefore make full use of the elastic and inelastic electron-specimen interactions. This review summarizes the possibilities of EFTEM for the investigation of biological specimens.
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