Updating correction procedures in quantitative electron‐probe microanalysis
1981; Wiley; Volume: 4; Issue: 3 Linguagem: Inglês
10.1002/sca.4950040302
ISSN1932-8745
Autores Tópico(s)Surface and Thin Film Phenomena
ResumoScanningVolume 4, Issue 3 p. 111-130 Original PaperFree to Read Updating correction procedures in quantitative electron-probe microanalysis G. Love, G. Love School of Materials Science, University of Bath, Bath BA2 7AY, UKSearch for more papers by this authorV. D. Scott, V. D. Scott School of Materials Science, University of Bath, Bath BA2 7AY, UKSearch for more papers by this author G. Love, G. Love School of Materials Science, University of Bath, Bath BA2 7AY, UKSearch for more papers by this authorV. D. Scott, V. D. Scott School of Materials Science, University of Bath, Bath BA2 7AY, UKSearch for more papers by this author First published: 1981 https://doi.org/10.1002/sca.4950040302Citations: 29AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References Andersen C A, Wittry D B: An evaluation of absorption correction functions for electron probe microanalysis. J Phys D: Appl Phys 1, 529–40 (1968) 10.1088/0022-3727/1/5/301 Web of Science®Google Scholar Archard G D, Mulvey T: The Effect of Atomic Number in X-ray Microanalysis. 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