
Modeling ferroelectric permittivity dependence on electric field and estimation of the intrinsic and extrinsic contributions
2015; Institute of Physics; Volume: 48; Issue: 3 Linguagem: Inglês
10.1088/0022-3727/48/3/035304
ISSN1361-6463
AutoresRolando Placeres Jiménez, José Pedro Rino, J. A. Eiras,
Tópico(s)Multiferroics and related materials
ResumoThe nonlinear dependence of the dielectric permittivity on electric field e (E) is modeled by the relationship e(E) = e00 + 1/(α + β Eeff 2 ), where Eeff = E + κ P(E). Using an appropriate mathematical representation of the polarization loop P(E), it is possible to describe correctly the hysteretic behavior of the curve e(E). This model allows the separation of the intrinsic and extrinsic contributions to the dielectric response from the experimental measurement of e(E). The model is validated for PZT and PLZT ferroelectric thin films. It is shown that the polarization hysteresis loop can be reconstructed from the curve e(E), which can be very useful for separating polarization current from leakage current in ferroelectric samples.
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