A Zeeman-effect based scatter correction system for non-dispersive atomic fluorescence spectrometry
1984; Elsevier BV; Volume: 39; Issue: 8 Linguagem: Inglês
10.1016/0584-8547(84)80117-2
ISSN1873-3565
AutoresD.A. Naranjit, Bernard Radziuk, J.C. Van Loon,
Tópico(s)X-ray Spectroscopy and Fluorescence Analysis
ResumoA Zeeman-effect based method of correcting for the scattering of source radiation in atomic fluorescence spectrometry (AFS) is described. The magnetic field is applied to the atomization cell in a direction transverse to the source and detected beams. Both polarized and field modulated Zeeman AFS are examined. Fluorescence signals corrected for scattering are derived from differences in the measured light intensities caused by changes in the incident light polarization and/or field intensity. Results are given for the determination of Cd in an Al matrix, and for Cd, Hg, and Zn in NBS fly ash, orchard leaves, and river sediment. The scatter corrected values obtained by this method are in agreement with certified values.
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