Growth and characterisation of L-arginine phosphate family crystals
1999; Elsevier BV; Volume: 204; Issue: 3 Linguagem: Inglês
10.1016/s0022-0248(99)00173-6
ISSN1873-5002
AutoresA.S. Haja Hameed, G. Ravi, Md.M. Hossain, P. Ramasamy,
Tópico(s)Analytical Chemistry and Sensors
ResumoIn order to improve the device characteristics of L-arginine phosphate (LAP) family of crystals, metals doping with oxides of copper and magnesium were examined. Mg-doped crystals enhance the growth along the c-axis; X-ray powder diffraction patterns were used to calculate the lattice parameters of the crystals. Fourier transform infra red (FTIR) spectroscopy and thermal analysis (DTA, TGA) were performed to study the molecular vibrations and thermal behaviour of the crystals, respectively. Mechanical characterisations such as micro-hardness studies on (1 0 0) and (0 1 0) planes were also carried out. The weight percentage of the doped copper and magnesium were calculated by atomic absorption spectroscopy (AAS).
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