A simple method to measure the lifetime of excited levels of rare earth ions: application to erbium ions in fluorophosphate glasses
1996; Elsevier BV; Volume: 5; Issue: 3 Linguagem: Inglês
10.1016/0925-3467(95)00060-7
ISSN1873-1252
AutoresMarc Brunel, Marc Vallet, Fabien Bretenaker, A. Le Floch, Jean‐Luc Adam, Nathalie Duhamel-Henry, J.Y. Allain,
Tópico(s)Luminescence Properties of Advanced Materials
ResumoA resonant technique, based on the sinusoidal modulation of the pump beam intensity, is demonstrated in the case of the precise measurement of the lifetime of the 4I132 level of erbium ions in fluorophosphate hosts. This intensity modulation is obtained via a rotation of the polarization of the pump beam. The large signal-to-noise ratio enables the use of low pump power and apparent lifetime shortenings due to ion-ion energy transfer processes and to amplification of spontaneous emission are circumvented. A parallel ith decay times deduced from usual fluorescence decay measurements is performed. Extension of the method to the spectroscopy of other rare-earth ions is discussed.
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