
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference
2011; SPIE; Volume: 8082; Linguagem: Inglês
10.1117/12.889404
ISSN1996-756X
AutoresI B Couceiro, Thiago Ferreira da Silva, Luiz Vicente Gomes Tarelho, Carlos L. S. Azeredo, I Malinovski, Hans P. H. Grieneisein, Wellington Santos Barros, G. Vilela de Faria, Jean Pierre von der Weid, Marcello Magri Amaral, Marcus Paulo Raele, Anderson Zanardi de Freitas,
Tópico(s)Photoacoustic and Ultrasonic Imaging
ResumoThis paper presents a methodology for providing traceability to OCT measurements linked to Length SI unit. The link to primary length standard is provided by an interference microscope (IM). The chosen transfer standard was a step height gauge block. The results for IM and OCT showed good agreement for step height standards, such that the OCT will be able to perform reliable measurements of complex surface topographies and to ensure traceability to the length scale. The main uncertainty components were evaluated for the OCT system. In addition, OCT also was used for measuring a surface roughness standard -a depth standard - in order to test this methodology for round groove profiles. Results were found to be in good agreement with the calibration certificate.
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