The c-axis thermal conductivity of graphite film of nanometer thickness measured by time resolved X-ray diffraction
2012; American Institute of Physics; Volume: 101; Issue: 23 Linguagem: Inglês
10.1063/1.4769214
ISSN1520-8842
AutoresMaher Harb, Clemens von Korff Schmising, H. Enquist, A. Jurgilaitis, Ivan Maximov, Petr Shvets, A. N. Obraztsov, Dmitry Khakhulin, Michaël Wulff, Jörgen Larsson,
Tópico(s)Silicon Carbide Semiconductor Technologies
ResumoWe report on the use of time resolved X-ray diffraction to measure the dynamics of strain in laser-excited graphite film of nanometer thickness, obtained by chemical vapour deposition (CVD). Heat transport in the CVD film is simulated with a 1-dimensional heat diffusion model. We find the experimental data to be consistent with a c-axis thermal conductivity of ∼0.7 W m−1 K−1. This value is four orders of magnitude lower than the thermal conductivity in-plane, confirming recent theoretical calculations of the thermal conductivity of multilayer graphene.
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