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A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

1999; American Institute of Physics; Volume: 70; Issue: 6 Linguagem: Inglês

10.1063/1.1149842

1527-2400

Jörg Rychen, Thomas Ihn, P. Studerus, A. Herrmann, K. Ensslin,

Integrated Circuits and Semiconductor Failure Analysis

A scanning force microscope was implemented operating at temperatures below 4.2 K and in magnetic fields up to 8 T. Piezoelectric quartz tuning forks were employed for nonoptical tip–sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed.