Portal de Periódicos da CAPES

RBS study of epitaxially grown thin films of the double perovskite La2NiMnO6

2007; Elsevier BV; Volume: 261; Issue: 1-2 Linguagem: Inglês

10.1016/j.nimb.2007.04.166

1872-9584

S. Budak, C. Muntele, I. Muntele, Hongjie Guo, Arunava Gupta, D. Ila,

Advanced Condensed Matter Physics

Epitaxial thin films of La2NiMnO6, a ferromagnetic semiconductor, have been fabricated on different substrates by pulsed laser deposition (PLD) [H. Guo, J. Burgess, S. Street, A. Gupta, T.G. Calvarese, M.A. Subramanian, Appl. Phys. Lett. 89 (2006) 0225509]. X-ray diffraction and Raman scattering observations show that the films are single crystalline and have an orthorhombic structure. Rutherford backscattering spectrometry (RBS) measurements were done on four different samples using 2.1 MeV He+ ions. We used RUMP simulation on the RBS data to extract information about the thickness and stoichiometry of the layers. In this paper, we are discussing the differences of the various films investigated.