Multi-resolution correlative focused ion beam scanning electron microscopy: Applications to cell biology
2013; Elsevier BV; Volume: 185; Issue: 3 Linguagem: Inglês
10.1016/j.jsb.2013.11.008
ISSN1095-8657
AutoresKedar Narayan, Cindy M. Danielson, Ken Lagarec, Bradley Lowekamp, Phil Coffman, Alexandre Laquerre, Michael W. Phaneuf, Thomas J. Hope, Sriram Subramaniam,
Tópico(s)Integrated Circuits and Semiconductor Failure Analysis
ResumoEfficient correlative imaging of small targets within large fields is a central problem in cell biology. Here, we demonstrate a series of technical advances in focused ion beam scanning electron microscopy (FIB–SEM) to address this issue. We report increases in the speed, robustness and automation of the process, and achieve consistent z slice thickness of ∼3 nm. We introduce "keyframe imaging" as a new approach to simultaneously image large fields of view and obtain high-resolution 3D images of targeted sub-volumes. We demonstrate application of these advances to image post-fusion cytoplasmic intermediates of the HIV core. Using fluorescently labeled cell membranes, proteins and HIV cores, we first produce a "target map" of an HIV infected cell by fluorescence microscopy. We then generate a correlated 3D EM volume of the entire cell as well as high-resolution 3D images of individual HIV cores, achieving correlative imaging across a volume scale of 109 in a single automated experimental run.
Referência(s)