Focused ion-beam crater arrays for induced nucleation of diamond film
1989; AIP Publishing; Volume: 7; Issue: 6 Linguagem: Inglês
10.1116/1.584653
ISSN2327-9877
AutoresA. R. Kirkpatrick, Bill Ward, N. P. Economou,
Tópico(s)Metal and Thin Film Mechanics
ResumoDiamond thin-films on nondiamond substrates characteristically exhibit a highly disordered polycrystalline microstructure and poor surface morphology. A major factor involved in this unsatisfactory growth behavior is a very-low density-of-nucleation on most surfaces. It is feasible that ion milling by a focused ion-beam can be utilized to introduce precise arrays of effective nucleation sites for diamond-film deposition. Possibilities for improved diamond-film microstructure and morphology are expected to result.
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