Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum
2005; American Institute of Physics; Volume: 87; Issue: 8 Linguagem: Inglês
10.1063/1.2012523
ISSN1520-8842
AutoresMarkus Heyde, Martin Sterrer, H.‐P. Rust, Hans‐Joachim Freund,
Tópico(s)Surface and Thin Film Phenomena
ResumoAtomic resolution with a double quartz tuning fork sensor for low-temperature ultrahigh vacuum atomic force and scanning tunneling microscopy is presented. The new features of the force sensor assembly are discussed. Atomically resolved images of MgO on Ag(001) have been obtained. Images acquired in the attractive and the repulsive regimes controlled to a constant frequency shift are shown, revealing contrast changes.
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