The EL2 Defect in GaAs: Some Recent Developments
1989; Wiley; Volume: 154; Issue: 1 Linguagem: Inglês
10.1002/pssb.2221540102
ISSN1521-3951
AutoresM. O. Manasreh, David W. Fischer, W. C. Mitchel,
Tópico(s)Transition Metal Oxide Nanomaterials
Resumophysica status solidi (b)Volume 154, Issue 1 p. 11-41 Review Article The EL2 Defect in GaAs: Some Recent Developments M. O. Manasreh, M. O. Manasreh Wright Research and Development Center, Materials Laboratory (WRDG/MLPO)Search for more papers by this authorD. W. Fischer, D. W. Fischer Wright Research and Development Center, Materials Laboratory (WRDG/MLPO)Search for more papers by this authorW. C. Mitchel, W. C. Mitchel Wright Research and Development Center, Materials Laboratory (WRDG/MLPO)Search for more papers by this author M. O. Manasreh, M. O. Manasreh Wright Research and Development Center, Materials Laboratory (WRDG/MLPO)Search for more papers by this authorD. W. Fischer, D. W. Fischer Wright Research and Development Center, Materials Laboratory (WRDG/MLPO)Search for more papers by this authorW. C. Mitchel, W. C. Mitchel Wright Research and Development Center, Materials Laboratory (WRDG/MLPO)Search for more papers by this author First published: 1 July 1989 https://doi.org/10.1002/pssb.2221540102Citations: 67 Wright Patterson Air Force Base, Ohio 45433–6533, USA. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References 1 G. P. Li and K. L. Wang, J. appl. Phys. 53, 8653 (1982). 2 J. Lagowski, H. C. Gatos, J. M. Parsey, K. Wada, M. Kaminska, and W. Walukiewics, Appl. Phys. Letters 40, 342 (1982). 3 E. R. Weber, H. Ennon, U. 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