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Pseudo moiré dislocations appearing in x-ray diffraction topography

1996; American Institute of Physics; Volume: 80; Issue: 4 Linguagem: Inglês

10.1063/1.363828

1520-8850

J. Yoshimura,

X-ray Diffraction in Crystallography

In recent x-ray moiré topographic experiments a dislocationlike discontinuity of moiré fringes has been found despite the fact that specimens (Si bicrystal) were dislocation free. This discontinuity, although similar in appearance to the fringe discontinuity known as moiré dislocation, should be essentially distinguished from it. Preliminary considerations suggest that the outbreak of such pseudo-moiré dislocations is related not only to the wave-field phase due to the moiré effect, but to the phase of extinction fringes. Pseudo-moiré dislocations commonly occur in plane-wave x-ray moiré topography of slightly strained specimens.