High-resolution pre-edge structure in the inner-shell ionization threshold region of rare gases Xe, Kr, and Ar
1996; American Physical Society; Volume: 54; Issue: 4 Linguagem: Inglês
10.1103/physreva.54.2834
ISSN1538-4446
AutoresO.-P. Sairanen, A. Kivimäki, E. Nõmmiste, H. Aksela, S. Aksela,
Tópico(s)Electron and X-Ray Spectroscopy Techniques
ResumoThe total ion and/or electron yield spectra of rare gases Xe, Kr, and Ar have been recorded around the 4${\mathit{d}}^{\mathrm{\ensuremath{-}}1}$, 3${\mathit{d}}^{\mathrm{\ensuremath{-}}1}$, and 2${\mathit{p}}^{\mathrm{\ensuremath{-}}1}$ ionization thresholds, respectively, with very high photon energy resolution at the Finnish beam line at the MAX I storage ring. Linewidths of the excited states are determined for higher excitations than earlier. The widths are observed to differ slightly for each core-excited state. \textcopyright{} 1996 The American Physical Society.
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