Catalyst analysis using synchrotron X-ray microscopy
1991; Elsevier BV; Volume: 56-57; Linguagem: Inglês
10.1016/0168-583x(91)96063-q
ISSN1872-9584
AutoresK.W. Jones, P. Spanne, Sam Webb, W. C. Conner, R.A Beyerlein, William J. Reagan, Frits M. Dautzenberg,
Tópico(s)Mineral Processing and Grinding
ResumoSynchrotron X-ray microscopy techniques have been used to characterize several different types of heterogeneous catalysts. Using a collimator to produce microbeams with a size of less than 10μm, maps of the elemental distributions based on detection of the fluorescent X-rays were made, and computed microtomography (CMT) techniques were applied to produce “ phase/density contrast” maps. CMT techniques were also used to determine the distribution of a specific major element by making measurements above and below the K X-ray absorption edge. The measurements were made using bending magnet radiation and, in one case, radiation from a 4 T superconducting wiggler at the National Synchrotron Light Source. Examples of applications to the study of polyethylene polymerization particles, fluid catalytic cracking catalysts, and hydrotreating catalysts are given.
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