Ion trajectories in the field-ion microscope
1973; IOP Publishing; Volume: 6; Issue: 12 Linguagem: Inglês
10.1088/0022-3735/6/12/025
ISSN2051-5685
Autores Tópico(s)Surface and Thin Film Phenomena
ResumoTrajectories of ions in a field-ion microscope have been calculated for the case of a tip taken as a hyperboloid of revolution and a flat screen. The calculated image projection is compared with experimentally determined projections. The calculations indicate that neither the mass nor the charge of the ion have any significant effect on the trajectory.
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