Ion trajectories in the field-ion microscope

1973; IOP Publishing; Volume: 6; Issue: 12 Linguagem: Inglês

10.1088/0022-3735/6/12/025

ISSN

2051-5685

Autores

L Gillot, J Sugden,

Tópico(s)

Surface and Thin Film Phenomena

Resumo

Trajectories of ions in a field-ion microscope have been calculated for the case of a tip taken as a hyperboloid of revolution and a flat screen. The calculated image projection is compared with experimentally determined projections. The calculations indicate that neither the mass nor the charge of the ion have any significant effect on the trajectory.

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