Effects of grain boundaries in polycrystalline silicon thin-film solar cells based on the two-dimensional model
2001; Elsevier BV; Volume: 65; Issue: 1-4 Linguagem: Inglês
10.1016/s0927-0248(00)00096-9
ISSN1879-3398
AutoresKen-ichi Kurobe, Yasuaki Ishikawa, Yukie Yamamoto, Takashi Fuyuki, Hiroyuki Matsunami,
Tópico(s)Semiconductor materials and interfaces
ResumoThe two-dimensional calculation for polycrystalline Si thin-film solar cells was performed. Two models, “stripe structure” and “columnar structure”, were applied for the solar cells composed of grains. For the stripe structure of 20μm active layer, to keep the efficiency distribution within 5% for individual unit cells, the stripe width requires more than 500μm for a minority-carrier lifetime of 1×10−5s and recombination velocity at the grain boundary of 1×104cm/s. For the columnar structure of 10μm active layer, to keep the efficiency independent of grain size, the recombination velocity should be kept less than 1×103cm/s. If imperfect passivation of a grain boundary is given, the way of decreasing carrier concentration to 1014cm−3 in an active layer may realize insusceptible output. An appropriate device modeling is needed in the two-dimensional calculation for polycrystalline Si thin films with an electron diffusion length close to or more than grain size and with a poorly passivated grain boundary. The calculated efficiency using bad model will include an error of about 1% as overestimation.
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