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Comparison of ICP-MS with spark ablation and GDMS for direct element analysis of conductive solids

1995; Elsevier BV; Volume: 50; Issue: 4-7 Linguagem: Inglês

10.1016/0584-8547(94)00157-q

1873-3565

Norbert Jakubowski, Ingo Feldmann, Dietmar Stuewer,

Electrochemical Analysis and Applications

The performance of two techniques for direct analysis of conducting samples has been compared in the analysis of the same standard reference materials with identical low resolution MS equipment and comparable operational conditions for both: inductively coupled plasma mass spectrometry (ICP-MS) with spark ablation and glow discharge mass spectrometry (GDMS). With individually optimized operational conditions, ICP-MS with spark ablation offers not only the advantage of significantly lower disturbances from interfering molecules but also shorter analysis time, whereas GDMS excels in particular by lower detection limits. Under compromise conditions to realize comparability also for the total analysis time, the analytical figures of merit are nearly identical preserving the advantage of low contributions form interferences in the case of spark ablation for sample introduction.