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Imaging of surfaces in LEED instruments

1982; IOP Publishing; Volume: 15; Issue: 3 Linguagem: Inglês

10.1088/0022-3735/15/3/007

2051-5685

Hans-Christian Bauer, Ron Schmid, H. Seiler,

X-ray Spectroscopy and Fluorescence Analysis

A new technique to obtain a magnified image of a surface with a low-energy electron diffraction instrument with central electron gun is described. It is achieved by scanning the primary electron beam by means of two pairs of Helmholtz coils externally attached to the apparatus. The technique can be used to analyse selected grains of polycrystalline samples by both LEED and AES.