Chemical dry etching of GaAs(100) by HC1: products, rate, and a kinetic model
1994; Elsevier BV; Volume: 312; Issue: 1-2 Linguagem: Inglês
10.1016/0039-6028(94)90816-8
ISSN1879-2758
AutoresChaochin Su, Zi-Guo Dai, Weiang Luo, Dong-Hong Sun, Matthew F. Vernon, Brian E. Bent,
Tópico(s)Electronic and Structural Properties of Oxides
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