Single-frequency cw vertical external cavity surface emitting semiconductor laser at 1003 nm and 501 nm by intracavity frequency doubling
2006; Springer Science+Business Media; Volume: 86; Issue: 3 Linguagem: Inglês
10.1007/s00340-006-2499-0
ISSN1432-0649
AutoresMathieu Jacquemet, M. Domenech, Gaëlle Lucas-Leclin, Patrick Georges, J. Dion, M. Strassner, I. Sagnes, A. Garnache,
Tópico(s)Semiconductor Quantum Structures and Devices
ResumoThis work reports single-frequency laser oscillation at λ=1003.4 nm of a diode-pumped vertical external cavity surface-emitting semiconductor laser for metrological applications. A low thermal resistance of the semiconductor active component is achieved by solid-liquid interdiffusion bonding onto a SiC substrate. The spectro-temporal dynamics of the laser is theoretically studied. Experimentally, an output power of 1.7 W is demonstrated in free running operation, and up to 500 mW in a true single longitudinal mode. Furthermore, single-frequency laser emission at λ=501.7 nm is obtained by intracavity frequency doubling, resulting in a total output power as high as 62 mW.
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