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Backscattering coefficient of multicomponent specimens

1984; Wiley; Volume: 6; Issue: 2 Linguagem: Inglês

10.1002/sca.4950060203

1932-8745

Roland Herrmann, L. Reimer,

Nuclear Physics and Applications

ScanningVolume 6, Issue 2 p. 20-29 Original PaperFree to Read Backscattering coefficient of multicomponent specimens R. Herrmann, R. Herrmann Physikalisches Institut, Universität Münster, Domagkstraße 75, D-4400 Münster, FRGSearch for more papers by this authorL. Reimer, L. Reimer Physikalisches Institut, Universität Münster, Domagkstraße 75, D-4400 Münster, FRGSearch for more papers by this author R. Herrmann, R. Herrmann Physikalisches Institut, Universität Münster, Domagkstraße 75, D-4400 Münster, FRGSearch for more papers by this authorL. Reimer, L. Reimer Physikalisches Institut, Universität Münster, Domagkstraße 75, D-4400 Münster, FRGSearch for more papers by this author First published: 1984 https://doi.org/10.1002/sca.4950060203Citations: 35AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL References Archard G D: Backscattering of electrons. J Appl Phys 32, 1505– 1509 (1961) Arnal F, Verdier P, Vincensini P D: Coefficient de rétro diffusion dans le cas d'électrons monocinétiques arrivant sur la cible sous une incidence oblique. 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Phys Rev 93, 891– 892 (1954) Niedrig H: Ein kombiniertes Einfachstreu- und Diffusionsmodell für die Elektronen-Rückstreuung dünner Schichten. BEDO 14, Remy, Münster 1981, pp 291– 308 Niedrig H: Electron backscattering from thin films. J Appl Phys 53, R15– R49 (1982) Philibert J, Weinryb E: The use of specimen current in electron-probe microanalysis. X-Ray Optics and Microanalysis (eds Pattee, Cosslett, Engström), Academic Press, New York 1963, pp 451– 476 Poole D M, Thomas P M: Quantitative electron-probe microanalysis. J Inst Met 90, 228– 233 (1962) Reimer L, Sommer K H: Messungen und Berechnungen zum elektronenmikroskopischen Streukontrast für 17–1200 keV-Elektronen. Z Naturforschung 23a, 1569– 1582 (1968) Reimer L, Krefting E R: The effect of scattering models on the results of Monte Carlo calculations. NBS Spec Publ 460, NBS Washington 1976, pp 45– 60 Reimer L, Tollkamp C: Measuring of the backscattering coefficient and secondary electron yield inside a scanning electron microscope. Scanning 3, 35– 39 (1980) Riley M E, MacCallum C J, Biggs F: Theoretical electron-atom elastic scattering cross sections. Atomic Data and Nuclear Data Tables 15, 443– 476 (1975) Saldick J, Allen A O: The yield of oxidation of ferrous sulfate in acid solution by high-energy cathode rays. J Chem Phys 22, 438– 442 (1954) Thümmel H W: Durchgang von Elektronenstrahlen durch Materieschichten, Streuabsorptionsmodelle. Akademie Verlag Berlin 1974, pp 253– 275 Yates A C: A program for calculating relativistic elastic electron-atom collision data. Comp Phys Comm 2, 175– 178 (1971) Citing Literature Volume6, Issue21984Pages 20-29 ReferencesRelatedInformation