Doppler Broadening of Positron Annihilation Photons in Silver Halide Crystals Following High Energy Implantations of C5+, N5+, O6+, and S6+
1972; American Institute of Physics; Volume: 57; Issue: 6 Linguagem: Inglês
10.1063/1.1678580
ISSN1520-9032
AutoresRoland Leber, Richard M. Lambrecht,
Tópico(s)Radiation Detection and Scintillator Technologies
ResumoThe Doppler broadening of positron annihilation photons detected by a Ge(Li) detector was employed to probe the interactions of positrons in high purity AgCl and AgBr (95%)+AgCl sheet crystals that had been exposed to 1011-1013 ions cm−2 of implanted 12C5+, 14N5+, 16O6+, or 32S6+. The narrowing of the Doppler broadened spectrum varied with the implanted ion, the concentration of the dopant, and the composition of the halide crystals. The decrease in linewidth is attributed to the electronic environment of the defects, and an increased probability of annihilation of near-thermal positrons with conduction electrons relative to annihilation with core electrons.
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