Plasmon excitation energies in ZnO, CdO, and MgO
1976; American Institute of Physics; Volume: 47; Issue: 1 Linguagem: Inglês
10.1063/1.322314
ISSN1520-8850
AutoresR. L. Hengehold, Frank L. Pedrotti,
Tópico(s)Advancements in Photolithography Techniques
ResumoA study has been made to experimentally determine the plasmon excitation energies in the oxides of Zn, Cd, and Mg using the reflection electron energy loss technique. The measurements were made on clean single-crystal surfaces using electrons of 250–1000-eV energy. Distinction was made between surface- and bulk-plasmon excitation by recording the changes which occurred in the energy loss spectrum as the surface was selectively contaminated. Surface-plasmon excitation energies of 17.0, 15.9, and 14.7 eV and bulk-plasmon excitation energies of 18.8, 22.8, and 22.0 eV were measured for ZnO, CdO, and MgO, respectively. Comparison is made with similar data obtained from optical reflectivity and transmission electron energy loss measurements.
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