Calibrated intensity noise measurements in microcavity laser diodes
1995; American Institute of Physics; Volume: 67; Issue: 25 Linguagem: Inglês
10.1063/1.115353
ISSN1520-8842
AutoresE. Goobar, J.W. Scott, B.J. Thibeault, G. D. Robinson, Yuliya Akulova, L. A. Coldren,
Tópico(s)Semiconductor Quantum Structures and Devices
ResumoViews Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation E. Goobar, J. W. Scott, B. Thibeault, G. Robinson, Y. Akulova, L. A. Coldren; Calibrated intensity noise measurements in microcavity laser diodes. Appl. Phys. Lett. 18 December 1995; 67 (25): 3697–3699. https://doi.org/10.1063/1.115353 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search
Referência(s)