Portal de Periódicos da CAPES

XPS study of the Li intercalation process in sol-gel-produced V2O5 thin film: influence of substrate and film synthesis modification

2005; Wiley; Volume: 37; Issue: 12 Linguagem: Inglês

10.1002/sia.2084

1096-9918

Neluţă Ibriş, Anna Maria Salvi, Massimiliano Liberatore, F. Decker, Angela Šurca,

ZnO doping and properties

Surface and Interface AnalysisVolume 37, Issue 12 p. 1092-1104 Research Article XPS study of the Li intercalation process in sol–gel-produced V2O5 thin film: influence of substrate and film synthesis modification Neluta Ibris, Neluta Ibris Dipartimento di Chimica, University of Basilicata, Potenza, ItalySearch for more papers by this authorAnna Maria Salvi, Corresponding Author Anna Maria Salvi salvi@unibas.it Dipartimento di Chimica, University of Basilicata, Potenza, ItalyDipartimento di Chimica, Università della Basilicata, Via N. Sauro 85, 85100, Potenza, Italy.Search for more papers by this authorMassimiliano Liberatore, Massimiliano Liberatore Dipartimento di Chimica, University 'La Sapienza', Roma, ItalySearch for more papers by this authorFranco Decker, Franco Decker Dipartimento di Chimica, University 'La Sapienza', Roma, ItalySearch for more papers by this authorAngela Surca, Angela Surca National Institute of Chemistry, Ljubljana, SloveniaSearch for more papers by this author Neluta Ibris, Neluta Ibris Dipartimento di Chimica, University of Basilicata, Potenza, ItalySearch for more papers by this authorAnna Maria Salvi, Corresponding Author Anna Maria Salvi salvi@unibas.it Dipartimento di Chimica, University of Basilicata, Potenza, ItalyDipartimento di Chimica, Università della Basilicata, Via N. Sauro 85, 85100, Potenza, Italy.Search for more papers by this authorMassimiliano Liberatore, Massimiliano Liberatore Dipartimento di Chimica, University 'La Sapienza', Roma, ItalySearch for more papers by this authorFranco Decker, Franco Decker Dipartimento di Chimica, University 'La Sapienza', Roma, ItalySearch for more papers by this authorAngela Surca, Angela Surca National Institute of Chemistry, Ljubljana, SloveniaSearch for more papers by this author First published: 22 September 2005 https://doi.org/10.1002/sia.2084Citations: 36AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Abstract We report on the process of lithium intercalation in V2O5 thin films deposited onto standard ITO-coated glass substrates. The films were deposited via a well-established sol–gel route, and the samples were examined as working electrodes in a range of potentials versus lithium reference electrode. This paper follows up issues arising from parallel spectroscopic characterizations of the films by X-ray photoelectron spectroscopy (XPS). Specifically, the XPS examination showed that not all of the Li-ion charge inserted was accounted for by the V(5) to V(4) reduction, but the stoichiometric balance could be maintained only by considering additional oxygens arising from the intercalation procedure, leading to Li2O formation. In this work, we have examined the possibility that the source of oxygen is the ITO substrate. To this purpose, films of V2O5 deposited on silicon substrates have been prepared using the sol–gel process and examined by XPS after electrochemical intercalation/de-intercalation cycles. We show that in this case a perfect balance between electrochemical charge, inserted Li and reduced vanadium is obtained. A further indication of ITO-substrate effects was obtained from examination, by the same methods, of some unconventional V2O5 films that had been co-precipitated with a siloxane, designed to provide a template structure. The results obtained from this material imply that a barrier layer is formed at the ITO interface and, therefore, the formation of Li2O is avoided. The results are discussed in terms of the possible degradation of conventional V2O5 on ITO as a result of electrochemically induced interface reactions. Copyright © 2005 John Wiley & Sons, Ltd. Citing Literature Volume37, Issue12December 2005Pages 1092-1104 RelatedInformation