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Surface Potential Mapping of SAM‐Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

2010; Volume: 23; Issue: 4 Linguagem: Inglês

10.1002/adma.201003122

1521-4095

David J. Ellison, Bumsu Lee, Vitaly Podzorov, C. Daniel Frisbie,

Mechanical and Optical Resonators

Advanced MaterialsVolume 23, Issue 4 p. 502-507 Communication Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy David J. Ellison, David J. Ellison Department of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USASearch for more papers by this authorBumsu Lee, Bumsu Lee Physics Department, Rutgers University, Piscataway, NJ 08854, USASearch for more papers by this authorV. Podzorov, V. Podzorov Physics Department, Rutgers University, Piscataway, NJ 08854, USASearch for more papers by this authorC. Daniel Frisbie, Corresponding Author C. Daniel Frisbie [email protected] Department of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USADepartment of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USA.Search for more papers by this author David J. Ellison, David J. Ellison Department of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USASearch for more papers by this authorBumsu Lee, Bumsu Lee Physics Department, Rutgers University, Piscataway, NJ 08854, USASearch for more papers by this authorV. Podzorov, V. Podzorov Physics Department, Rutgers University, Piscataway, NJ 08854, USASearch for more papers by this authorC. Daniel Frisbie, Corresponding Author C. Daniel Frisbie [email protected] Department of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USADepartment of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USA.Search for more papers by this author First published: 06 December 2010 https://doi.org/10.1002/adma.201003122Citations: 73Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Graphical Abstract Kelvin probe force microscopy measurements on rubrene single crystals partially coated with fluorinated and non-fluorinated SAM derivatives are employed to determine the SAM-induced surface potentials caused by an interfacial charge-transfer doping process resulting in an interface dipole. The surface potential and topographic information in turn allow calculation of the effective intramolecular electric fields and carrier densities due to doping in the SAM-modified rubrene crystals. References 1 M. F. Calhoun, J. Sanchez, D. Olaya, M. E. Gershenson, V. Podzorov, Nat. Mater. 2008, 7, 84. 2 V. Podzorov, V. M. Pudalov, M. E. Gershenson, Appl. Phys. Lett. 2004, 85, 6039. 3 V. Podzorov, V. M. Pudalov, M. E. Gershenson, Appl. Phys. Lett. 2005, 87, 093505. 4 I. H. Campbell, S. Rubin, T. A. Zawodzinski, J. D. Kress, R. L. Martin, D. L. Smith, N. N. Barashkov, J. P. Ferraris, Phys. Rev. B, 1996, 54, R14321. 5 G. Ashkenasy, D. Cahen, R. Cohen, A. 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Batlogg, Phys. Rev. B 2010, 81, 155315. 29 H. Ding, Y. Gao, Appl. Phys. A 2009, 95, 89. 30 N. Hayashi, H. Ishii, Y. Ouchi, K. Seki, J. Appl. Phys. 2002, 92, 3784. 31 H. Peisert, M. Knupfer, J. Fink, Appl. Phys. Lett. 2002, 81, 2400. Citing Literature Supporting Information Detailed facts of importance to specialist readers are published as "Supporting Information". Such documents are peer-reviewed, but not copy-edited or typeset. They are made available as submitted by the authors. Filename Description adma_201003122_sm_suppl.pdf340.4 KB suppl Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article. Volume23, Issue4January 25, 2011Pages 502-507 ReferencesRelatedInformation