Conducting defects in Langmuir-Blodgett films
1989; Elsevier BV; Volume: 178; Issue: 1-2 Linguagem: Inglês
10.1016/0040-6090(89)90345-3
ISSN1879-2731
AutoresHiro Matsuda, Hiroki Kawada, K. Takimoto, Yoshinori Morikawa, Ken Eguchi, T. Nakagiri,
Tópico(s)Characterization and Applications of Magnetic Nanoparticles
ResumoA copper decoration method was employed to visualize the conducting defects in Langmuir-Blodgett (LB) films under an optical microscope. The resulting copper decoration patterns strictly reflected the morphology of the LB films.
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