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Axial nanoscale localization by normalized total internal reflection fluorescence microscopy

2014; Optica Publishing Group; Volume: 39; Issue: 4 Linguagem: Inglês

10.1364/ol.39.000869

1539-4794

Marcelina Cardoso Dos Santos, Régis Deturche, Cyrille Vézy, Rodolphe Jaffiol,

Force Microscopy Techniques and Applications

We present a simple modification of a standard total internal reflection fluorescence microscope to achieve nanometric axial resolution, typically ≈10 nm. The technique is based on a normalization of total internal reflection images by conventional epi-illumination images. We demonstrate the potential of our method to study the adhesion of phopholipid giant unilamellar vesicles.