OTF measurements with a white light source: an interferometric technique
1975; Optica Publishing Group; Volume: 14; Issue: 7 Linguagem: Inglês
10.1364/ao.14.001613
ISSN0003-6935
Autores Tópico(s)Optical Coatings and Gratings
ResumoThe use of lateral shear interferometers for measuring the optical transfer function of an optical system for a white light source is investigated. It is shown that grating lateral shear interferometers fulfill the requirements necessary to perform measurements of both the optical transfer function and the optical coherence function for a white light source. Several possible grating lateral shear interferometers are described.
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