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Continuous serial thin sectioning for electron microscopy

1984; Wiley; Volume: 1; Issue: 4 Linguagem: Inglês

10.1002/jemt.1060010407

1553-0817

Wolf H. Fahrenbach,

Cell Image Analysis Techniques

Abstract The process of serial sectioning for electron microscopy has been refined such that loss of thin sections is kept below 0.1% and the series is continued at will. The method relies on microscopic control of all manipulative steps, Formvar casting on plate glass for coated slot grids, coating of the block with contact cement for reliable ribboning, pickup by a one‐step method with grid support in the diamond knife trough, staining in LKB grid holders, gentle treatment of grids in the electron microscope, and a slight modification to the microscope for safe grid withdrawal. The results are particularly applicable to the reconstruction of neuronal microcircuits and larger volumes of neuropil.