Confocal μ-XRF depth analysis of paint layers
2004; Elsevier BV; Volume: 219-220; Linguagem: Inglês
10.1016/j.nimb.2004.01.024
ISSN1872-9584
AutoresŽ. Šmit, Koen Janssens, K. Proost, I. Langus,
Tópico(s)Nuclear Physics and Applications
ResumoFocused narrow-band beam of the synchrotron radiation was used for in-depth analysis of historic and modern paint layers. The fluorescent radiation induced by 21 keV impact radiation was detected by a Si(Li) detector equipped with a polycapillary X-ray lens in con-focal geometry. Scanning of the sample was performed by a motorized x–y–z stage. Space resolution of 30 μm was achieved. The procedure of evaluation of concentrations was based on the independent parameter method and included absorption of radiation in the outer layers and secondary fluorescence enhancement induced by hard X-rays of the same and neighboring layers.
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