Work function of ITO substrates and band-offsets at the TPD/ITO interface determined by photoelectron spectroscopy
2000; Elsevier BV; Volume: 111-112; Linguagem: Inglês
10.1016/s0379-6779(99)00355-0
ISSN1879-3290
AutoresL. Chkoda, Clemens Heske, M. Sokołowski, E. Umbach, Friedrich W. Steuber, J. Staudigel, M. Stößel, J. Simmerer,
Tópico(s)Electron and X-Ray Spectroscopy Techniques
Referência(s)