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Semiconductor laser confocal microscopy

1994; Optica Publishing Group; Volume: 33; Issue: 4 Linguagem: Inglês

10.1364/ao.33.000578

0003-6935

R. Juškaitis, Nigel P. Rea, T. Wilson,

Advanced Fluorescence Microscopy Techniques

A compact scanning microscope that uses a semiconductor laser both to illuminate a specimen and to detect the signal reflected from it is described. It is demonstrated that the spatial filtering performed by the laser detector ensures confocal operation. Two detection regimes, one employing a laser power monitor and the other using the diode junction voltage as a signal, are compared.