Focused Ion Beam (FIB) tomography of nanoindentation damage in nanoscale metal/ceramic multilayers
2010; Elsevier BV; Volume: 61; Issue: 4 Linguagem: Inglês
10.1016/j.matchar.2010.01.005
ISSN1873-4189
AutoresDavinder Singh, Nikhilesh Chawla, Y.-L. Shen,
Tópico(s)Ion-surface interactions and analysis
ResumoNanoscalematerialshavebecome increasingly important inview of their new and improved properties. In particular, a lot of attention has been paid to nanolaminates due to their unique electrical [1–3], magnetic [4] optical [5,6] and mechanical properties [7–9].Mostof the researchtodatehas focusedonmetal–metal and ceramic–ceramic laminates. Metal–ceramic systems, in particular, exhibit a good combination of strength, hardness, and toughness. We have previously used nanoindentation to probe themechanicalpropertiesof thesematerials [10–12].Due to the complex nature of the multilayer structure the stress state under the indenter is quite complex [13,14]. We have previously used the Focused Ion Beam (FIB) technique to section the indentations and examine the nature of damage [10]. Using two dimensional (2D) sections a combination of SiC fracture and
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