Three-dimensional imaging of nonspherical silicon nanoparticles embedded in silicon oxide by plasmon tomography
2006; American Institute of Physics; Volume: 89; Issue: 15 Linguagem: Inglês
10.1063/1.2360906
ISSN1520-8842
AutoresAycan Yurtsever, Matthew Weyland, David A. Muller,
Tópico(s)Semiconductor materials and devices
ResumoSilicon nanoparticles embedded in silica show promising optoelectronic properties, due to quantum confinement and/or radiative interface states that should correlate with the particles’ average size and shape. Here the authors report the combination of electron tomography with plasmon-filtered microscopy in order to reconstruct the three-dimensional morphology of silicon nanoparticles. They find that particles with complex morphologies and high surface to volume ratios are dominant, rather than the commonly assumed near-spherical structures. These results should affect quantum-confined excitons and the interface density of states. Their findings may help to explain the physical origin of the unusually broad photoluminescence bands and efficiencies.
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