Enhanced counterion localization induced by surface charge modulation
2002; Institute of Physics; Volume: 58; Issue: 5 Linguagem: Inglês
10.1209/epl/i2002-00418-8
ISSN1286-4854
AutoresD. B. Lukatsky, S. A. Safran, A. W. C. Lau, P. Pincus,
Tópico(s)Non-Destructive Testing Techniques
ResumoUsing both small-amplitude and singular-perturbation theories we predict theoretically that the presence of surface charge modulations gives rise to an enhancement of the counterion density near the surface above and beyond that of a uniform, charged surface. We confirm these predictions with Monte Carlo simulations. Our study focuses on the weak- to moderate-coupling regime which is complementary to a similar investigation performed by Moreira and Netz (Europhys. Lett., 57 (2002) 911) in the strong-coupling case.
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