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Quantification of Grain Boundary Segregation Monolayers by X-ray Spectroscopy in a Scanning Electron Microscope

2011; Oxford University Press; Volume: 17; Issue: S2 Linguagem: Inglês

10.1017/s1431927611003886

1435-8115

Paweł Nowakowski, F. Christien, Marion Allart, Yann Borjon-Piron, R. Le Gall, Jean-Claude Ménard, Hubert Mantz,

Surface and Thin Film Phenomena

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.