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Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor

2014; Oxford University Press; Volume: 63; Issue: 2 Linguagem: Inglês

10.1093/jmicro/dft051

2050-5701

Lionel C. Gontard, Grigore Moldovan, Ricardo Carmona‐Galán, Chao Cheng Lin, Angus I. Kirkland,

Integrated Circuits and Semiconductor Failure Analysis

Journal Article Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor Get access Lionel C. Gontard, Lionel C. Gontard * 1Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, UK2Instituto de Ciencia de Materiales de Sevilla (ICMSE-CSIC), Avda. Américo Vespucio 49, Sevilla 41092, Spain *To whom correspondence should be addressed. E-mail: lionel.cervera@icmse.csic.es Search for other works by this author on: Oxford Academic PubMed Google Scholar Grigore Moldovan, Grigore Moldovan 1Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, UK Search for other works by this author on: Oxford Academic PubMed Google Scholar Ricardo Carmona-Galán, Ricardo Carmona-Galán 3Instituto de Microelecrónica de Sevilla (IMSE-CNM), CSIC-Universidad de Sevilla, Avda. Américo Vespucio s/n, Sevilla 41092, Spain Search for other works by this author on: Oxford Academic PubMed Google Scholar Chao Lin, Chao Lin 1Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, UK Search for other works by this author on: Oxford Academic PubMed Google Scholar Angus I. Kirkland Angus I. Kirkland 1Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, UK Search for other works by this author on: Oxford Academic PubMed Google Scholar Microscopy, Volume 63, Issue 2, April 2014, Pages 119–130, https://doi.org/10.1093/jmicro/dft051 Published: 08 January 2014 Article history Received: 28 June 2013 Accepted: 28 November 2013 Published: 08 January 2014