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First observations of power MOSFET burnout with high energy neutrons

1996; Institute of Electrical and Electronics Engineers; Volume: 43; Issue: 6 Linguagem: Inglês

10.1109/23.556885

1558-1578

D.L. Oberg, J.L. Wert, E. Normand, Paweł Majewski, S.A. Wender,

Advanced Battery Technologies Research

Single event burnout was seen in power MOSFETs exposed to high energy neutrons. Devices with rated voltage /spl ges/400 volts exhibited burnout at substantially less than the rated voltage. Tests with high energy protons gave similar results. Burnout was also seen in limited tests with lower energy protons and neutrons. Correlations with heavy-ion data are discussed. Accelerator proton data gave favorable comparisons with burnout rates measured on the APEX spacecraft. Implications for burnout at lower altitudes are also discussed.