Dependence of Neel Temperature on Ultrathin Film Thickness
2013; Trans Tech Publications; Volume: 813; Linguagem: Inglês
10.4028/www.scientific.net/amr.813.319
ISSN1662-8985
Autores Tópico(s)Physics of Superconductivity and Magnetism
ResumoWithin the frame of average spin model the calculation of dependence of critical phase transition temperature in antiferromagnetic ultrathin films of different crystalline structure on their thickness has been carried out. I has been shown, that relative change of Neel temperature is subject to power law with exponent close to the experimental values.
Referência(s)