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Embedded Loopback Test for RF ICs

2005; Institute of Electrical and Electronics Engineers; Volume: 54; Issue: 5 Linguagem: Inglês

10.1109/tim.2005.855091

1557-9662

Jangsup Yoon, W.R. Eisenstadt,

Electromagnetic Compatibility and Noise Suppression

This paper explores the use of on-chip or on-wafer loopback implementations for verifying performance of 5-GHz wireless local area network (WLAN) IC circuits. The loopback test diagram, the test-circuit design, and the characterization data are reported for subcircuits (attenuators, and switches) necessary to implement 5-GHz transceiver loopback. A loopback circuit that can be applied to transceiver loopback measurements is demonstrated. This research is exploratory in nature and is a first attempt at a new on-chip RF test technique.