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Significantly Reduced Bimolecular Recombination in a Novel Silole‐Based Polymer: Fullerene Blend

2011; Wiley; Volume: 1; Issue: 6 Linguagem: Inglês

10.1002/aenm.201100390

1614-6840

Tracey M. Clarke, Deanna B. Rodovsky, Andrew A. Herzing, Jeff Peet, Gilles Dennler, Dean M. DeLongchamp, Christoph Lungenschmied, Attila J. Mozer,

Semiconductor materials and interfaces

Advanced Energy MaterialsVolume 1, Issue 6 p. 1062-1067 Communication Significantly Reduced Bimolecular Recombination in a Novel Silole-Based Polymer: Fullerene Blend Tracey M. Clarke, Corresponding Author Tracey M. Clarke [email protected] ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, AustraliaARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.Search for more papers by this authorDeanna B. Rodovsky, Deanna B. Rodovsky National Institute of Standards and Technology, Gaithersburg, MD 20899, USA Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USASearch for more papers by this authorAndrew A. Herzing, Andrew A. Herzing National Institute of Standards and Technology, Gaithersburg, MD 20899, USASearch for more papers by this authorJeff Peet, Jeff Peet Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USASearch for more papers by this authorGilles Dennler, Gilles Dennler Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA IMRA Europe, 220, rue Albert Caquot - BP 213, 06904 Sophia-Antipolis Cedex, FranceSearch for more papers by this authorDean DeLongchamp, Dean DeLongchamp National Institute of Standards and Technology, Gaithersburg, MD 20899, USASearch for more papers by this authorChristoph Lungenschmied, Christoph Lungenschmied Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USASearch for more papers by this authorAttila J. Mozer, Corresponding Author Attila J. Mozer [email protected] ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, AustraliaARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.Search for more papers by this author Tracey M. Clarke, Corresponding Author Tracey M. Clarke [email protected] ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, AustraliaARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.Search for more papers by this authorDeanna B. Rodovsky, Deanna B. Rodovsky National Institute of Standards and Technology, Gaithersburg, MD 20899, USA Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USASearch for more papers by this authorAndrew A. Herzing, Andrew A. Herzing National Institute of Standards and Technology, Gaithersburg, MD 20899, USASearch for more papers by this authorJeff Peet, Jeff Peet Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USASearch for more papers by this authorGilles Dennler, Gilles Dennler Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA IMRA Europe, 220, rue Albert Caquot - BP 213, 06904 Sophia-Antipolis Cedex, FranceSearch for more papers by this authorDean DeLongchamp, Dean DeLongchamp National Institute of Standards and Technology, Gaithersburg, MD 20899, USASearch for more papers by this authorChristoph Lungenschmied, Christoph Lungenschmied Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USASearch for more papers by this authorAttila J. Mozer, Corresponding Author Attila J. Mozer [email protected] ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, AustraliaARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.Search for more papers by this author First published: 12 September 2011 https://doi.org/10.1002/aenm.201100390Citations: 61Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Graphical Abstract Charge transport measurements reveal non-Langevin recombination for KP115:PCBM organic photovoltaic devices. This rare but highly advantageous behaviour allows a long charge carrier drift length and thus devices with thick active layers retain a high fill factor. However, no clear correlation with morphology was found, indicating that the origin of non-Langevin recombination may be more complex than previously thought. Supporting Information Detailed facts of importance to specialist readers are published as "Supporting Information". Such documents are peer-reviewed, but not copy-edited or typeset. They are made available as submitted by the authors. Filename Description aenm_201100390_sm_suppl.pdf434.6 KB suppl Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. 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