Direct imaging of x rays with a CCD using hardware processing
1991; American Institute of Physics; Volume: 62; Issue: 2 Linguagem: Inglês
10.1063/1.1142128
ISSN1527-2400
Autores Tópico(s)CCD and CMOS Imaging Sensors
ResumoThis study investigated the direct imaging of low intensity x-rays by a room-temperature charge coupled device (CCD). Commercial CCD evaluation kits read out the information and provided initial processing of the data. The extraction of the signal from noise was achieved using NIM modules rather than by storing and numerically analyzing the data. Due to the fast processing at standard TV rates, the storage of the data required conversion of the signal from a timing to a pulse height analysis (PHA) spectrum. The tested CCDs were found to have lower efficiency relative to the proportional counter for the range of photon energies (1.5–8.0 keV) studied but had higher spatial resolution than gas-filled position-sensitive detectors. Application of CCDs for x-ray energy dispersive detectors is described.
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