The effect of RuO 2 /Pt hybrid bottom electrode structure on the leakage and fatigue properties of chemical solution derived Pb(Zr x Ti 1− x )O 3 thin films
1999; Springer Nature; Volume: 14; Issue: 3 Linguagem: Inglês
10.1557/jmr.1999.0135
ISSN2044-5326
AutoresSeung‐Hyun Kim, J. G. Hong, S. K. Streiffer, Angus I. Kingon,
Tópico(s)Semiconductor materials and devices
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